Module Specifications.
Current Academic Year 2024 - 2025
All Module information is indicative, and this portal is an interim interface pending the full upgrade of Coursebuilder and subsequent integration to the new DCU Student Information System (DCU Key).
As such, this is a point in time view of data which will be refreshed periodically. Some fields/data may not yet be available pending the completion of the full Coursebuilder upgrade and integration project. We will post status updates as they become available. Thank you for your patience and understanding.
Date posted: September 2024
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Description The purpose of this module is to provide participants with a broad introduction to the fundamentals concepts of surface physics. In this module students will develop knowledge and skills relating to surface structures, and an array of surface analysis techniques. The course aims to give students a full and thorough knowledge of these topics with emphasis placed techniques used in industrial applications to monitor material properties after treatment. Students are expected to access all course material online, participate in online discussion groups where they can discuss the course material and set problems relating to the course material, and participate in various learning activities and continuous assessment tasks on a regular basis. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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Learning Outcomes 1. Describe surface structure of common crystal configurations. 2. Relate secondary electron spectra to surface chemical composition for both ESCA and Auger electron spectroscopy. 3. Understand the basics principles of SIMS anaylsis of surface composition. 4. Compare electron microscope and AFM surface analysis. 5. Discuss x ray diffraction and electron diffraction techniques in relation to surface structure analysis. 6. Solve applied problems, identifying the key parameters involved and performing relevant numerical calcuations. 7. Communicate the material covered and its applications to their collegues. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||
All module information is indicative and subject to change. For further information,students are advised to refer to the University's Marks and Standards and Programme Specific Regulations at: http://www.dcu.ie/registry/examinations/index.shtml |
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Indicative Content and Learning Activities
Indicative syllabusSurface structure of crystals. Electron energy analysers. X-ray and Electron sources / monochromators. UV and X-ray Photoelectron Spectroscopy (PES, XPS). Auger Electron Spectroscopy (AES). Secondary ion mass spectroscopy (SIMS). Quantitative analysis by XPS, AES, SIMS. Electron microscope, AFM. Surface Structure: 2 dimensional lattices. Low Energy Electron Diffraction (LEED). Reflection High Energy Electron Diffraction (RHEED). Scanning Tunnelling Microscopy (STM). X-Ray Diffraction. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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